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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
Ge
Formula:
Sb/Ge
Name:
antimony/germanium
CAS Registry No:
7440-56-4
Class:
element

Citation:
Author Name(s):
Yang X., Cao R., Terry J., Pianetta P.
Journal:
J. Vac. Sci. Technol. B 10, 2013
DOI:
Pub Year:
1992

Data Processing:
Data Type:
Interface Core-Level Shift
Line Designation:
INT-3d5/2
Interface Core-Level Shift
-0.18
Energy Uncertainty:
0.02
Background Subtraction Method:
other
Peak Location Method:
mixed Gaussian/Lorentzian
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
0.25
Lorentzian Width (eV):
0.19

Measurement:
Use of X-ray Monochromator:
Yes
Anode Material:
other source
X-ray Energy:
62.5
Overall Energy Resolution (eV):
0.25
Calibration:
Charge Reference:
Element
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
1 ML Sb/Ge(100)-(1x1). The surface was prepared by depositing several monolayers of Sb on the clean Si(100) surface and then annealing at 773 K. Peak locations: Voigt function. Branching ratio = 0.67. The intensity ratio of the surface/bulk components wa

Specimen:
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Low-energy Electron Diffraction
Specimen Temperature (K):
300
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