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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:


Tab Page Summary

General:
gallium(III) arsenide
arsenide, II-VI semiconductor, III-V semiconductor

Citation:
Bratina G., Sorba L., Antonini A., Vanzetti L., Franciosi A.
J. Vac. Sci. Technol. B 9, 2225
Pub Year:
1991

Data Processing:
Photoelectron Line

Measurement:
Anode Material:
Al
X-ray Energy:
Overall Energy Resolution (eV):
0.69
Calibration:
Charge Reference:
Valence band minimum
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
n-type GaAs. Emission angle = 55 degrees.

Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300

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