NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Ba

Ba/Si

barium/silicon

CAS Registry No:

7440-39-3

alkaline earth, element, silicide

Citation:

Author Name(s):

Weijs P.J.W., van Acker J.F., Fuggle J.C., van der Heide P.A.M., Haak H., and Horn K.

Surf. Sci. 260, 102

Pub Year:

1992

book All Records in this Publication

Data Processing:

Photoelectron Line

Line Designation:

4d_5/2

Binding Energy (eV)

91.40

Energy Uncertainty:

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Yes

Anode Material:

other source

X-ray Energy:

120

Overall Energy Resolution (eV):

0.5

Calibration:

FL = Fermi level

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

0.1 ML Ba/n-type As-doped Si(100)-(2x1). The substrate was cleaned by etching in a 1% HF in water solution, followed by mild Ar+ ion bombardment and annealing by direct current flow through the sample.

Specimen:

Method of Determining Specimen Composition:

X-ray Photoelectron Spectroscopy

Method of Determining Specimen Crystallinity:

Low-energy Electron Diffraction

Specimen Temperature (K):

300

An error has occurred. This application may no longer respond until reloaded. Reload 🗙