Tab Page Summary
carbide, II-VI semiconductor, IV semiconductor, IV-VI semiconductor, silicide
Waldrop J.R., Grant R.W., Wang Y.C., Davis R.F.
Overall Energy Resolution (eV):
Calibration:
Au4f7 = 84.00
Charge Reference:
Valence band minimum
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
The 6H polytype of hexagonal n-type alpha-SiC(000-1)-(1x1). The sample was heated to 873 K for a short time.
Method of Determining Specimen Composition:
X-ray Photoelectron Spectroscopy
Method of Determining Specimen Crystallinity:
Low-energy Electron Diffraction
Specimen Temperature (K):
300