NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Cu₂S

copper(I) sulfide

22205-45-4

chalcogenide, IV-VI semiconductor, mineral, sulfide

Citation:

Author Name(s):

Kutty T.R.N.

Journal:

Mater. Res. Bull. 26, 399

DOI:

Pub Year:

1991

book All Records in this Publication

Data Processing:

Photoelectron Line

121.40

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Yes

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Au4f7 = 84.00

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

Chalcocite.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300