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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:


Tab Page Summary

General:
nickel sulfide
16812-54-7
chalcogenide, II-VI semiconductor, sulfide

Citation:
Matoba M., Anzai S., Fujimori A.
J. Phys. Soc. Japan 60, 4230
Pub Year:
1991

Data Processing:
Photoelectron Line
mixed Gaussian/Lorentzian

Measurement:
Anode Material:
Mg
X-ray Energy:
Overall Energy Resolution (eV):
1
Calibration:
Au4f7 = 84.00
Charge Reference:
Conductor
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
The sample was cleaned by Ar+ ion bombardment (Ep = 0.5 keV, time = 1 min, normal incidence). Asymmetry parameter = 0.01. Branching ratio = 0.5.

Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300

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