NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

Pt₃(SnF₃)₂((C₆H₅)₂PCH₂P(C₆H₅)₂)₃[PF₆]

XPS Formula:

carbon atoms attached to P

Name:

bis-mu3-trifluorostannatetris-mu-([(diphenylphosphino)methyl]diphenylphosphine)triplatinum

CAS Registry No:

Class:

cluster, organometallic, phenyl benzene

Citation:

Author Name(s):

Jennings M.C., Schoettel G., Roy S., Puddephatt R.J., Douglas G., et al.

Journal:

Organometallics 10, 580

DOI:

Pub Year:

1991

bookAll Records in this Publication

Data Processing:

Photoelectron Line

282.90

Background Subtraction Method:

other

Peak Location Method:

Gaussian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Internal hydrocarbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

X-ray Diffraction

Specimen Temperature (K):

300