NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

W₃S₄(H₂O)₉(CH₃C₆H₄SO₃)₄.9H₂O

Name:

mu3-thiotris-mu-thiotris(triaquatungsten) tetrakis(toluene-4-sulfonate) nonahydrate

CAS Registry No:

Class:

cluster, organometallic, phenyl benzene, sulfide, sulfur ligand, water ligand

Citation:

Author Name(s):

Shibahara T., Yamasaki M.

Journal:

Inorg. Chem. 30, 1687

DOI:

Pub Year:

1991

bookAll Records in this Publication

Data Processing:

Photoelectron Line

4f_7/2

33.60

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Internal hydrocarbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

X-ray Diffraction

Specimen Temperature (K):

300