NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Cr

Cr₃Si

trichromium silicide

CAS Registry No:

silicide

Citation:

Author Name(s):

Johansson L.I., Hakansson K.L., Karlsson U.O., Christensen A.N.

Surf. Sci. 251, 101

Pub Year:

1991

All Records in this Publication

Data Processing:

Surface Core-level Shift

Line Designation:

SS-3p_3/2

Surface Core-Level Shift (eV)

0.00

Energy Uncertainty:

Background Subtraction Method:

other

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

0.40

Lorentzian Width (eV):

1.0

Measurement:

Use of X-ray Monochromator:

Yes

Anode Material:

other source

X-ray Energy:

110

Overall Energy Resolution (eV):

0.2

Calibration:

FL = Fermi level

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

Cr3Si(100) was cleaned by Ar+ ion bombardment (Ep = 600 eV, Ip = 20 mA, time = 5 min) followed by repeated short ( < 1 min ) annealings to 1073 K. A distinct LEED pattern with a weak contribution of a 2x1reconstruction was observed. Branching ratio = 0.27

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Low-energy Electron Diffraction, X-ray Diffraction

Specimen Temperature (K):

300

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