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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
Cr
Formula:
Cr3Si
Name:
trichromium silicide
CAS Registry No:
Class:
silicide

Citation:
Author Name(s):
Johansson L.I., Hakansson K.L., Karlsson U.O., Christensen A.N.
Journal:
Surf. Sci. 251, 101
DOI:
Pub Year:
1991

Data Processing:
Data Type:
Surface Core-level Shift
Line Designation:
SS-3p3/2
Surface Core-Level Shift (eV)
0.00
Energy Uncertainty:
Background Subtraction Method:
other
Peak Location Method:
mixed Gaussian/Lorentzian
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
0.40
Lorentzian Width (eV):
1.0

Measurement:
Use of X-ray Monochromator:
Yes
Anode Material:
other source
X-ray Energy:
110
Overall Energy Resolution (eV):
0.2
Calibration:
FL = Fermi level
Charge Reference:
Conductor
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
Cr3Si(100) was cleaned by Ar+ ion bombardment (Ep = 600 eV, Ip = 20 mA, time = 5 min) followed by repeated short ( < 1 min ) annealings to 1073 K. A distinct LEED pattern with a weak contribution of a 2x1reconstruction was observed. Branching ratio = 0.27

Specimen:
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Low-energy Electron Diffraction, X-ray Diffraction
Specimen Temperature (K):
300
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