NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

CH₃(CH₂)₂₀C(O)OH/CaF₂

XPS Formula:

CH₃(CH₂)₂₀C(O*)O*H/CaF₂

Name:

behenic acid/calcium difluoride

CAS Registry No:

112-85-6

Class:

organic acid, oxygen

Citation:

Author Name(s):

Zylberajch-Antoine C., Barraud A., Roulet H., Dufour G.

Journal:

Appl. Surf. Sci. 52, 323

DOI:

Pub Year:

1991

bookAll Records in this Publication

Data Processing:

Photoelectron Line

532.70

Background Subtraction Method:

Shirley

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Internal hydrocarbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

Langmuir-Blodgette film. Aliphatic carbons were used for charge reference. FAT mode. Docosanoic acid.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300