NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

HgS

mercury sulfide

1344-48-5

chalcogenide, II-VI semiconductor, mineral, sulfide

Citation:

Author Name(s):

Zylberajch-Antoine C., Barraud A., Roulet H., Dufour G.

Journal:

Appl. Surf. Sci. 52, 323

DOI:

Pub Year:

1991

bookAll Records in this Publication

Data Processing:

Photoelectron Line

4f_7/2

101.00

Background Subtraction Method:

Shirley

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

Alpha-HgS red powder. FAT mode.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300