NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

C

CH₃(CH₂)₁₇SH/Au

octadecanethiol/gold

CAS Registry No:

2885-00-9

sulfur, thiol

Citation:

Author Name(s):

Tarlov M.J.

Langmuir 8, 80

Pub Year:

1992

book All Records in this Publication

Data Processing:

Photoelectron Line

Line Designation:

1s

Binding Energy (eV)

285.00

Energy Uncertainty:

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

1.5

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

No

Anode Material:

Al

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

FL = Fermi level

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

27+-2 A CH3(CH2)17CH2/2000 A polycrystalline Au. Self-assembled monolayer. FAT mode. The film thicknesses were determined by ellipsometry and stylus measurements. The amount of deposited Ag was measured using a quartz-crystal thickness monitor.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

X-ray Diffraction

Specimen Temperature (K):

300

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