NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

((C₂H₅)₄N)₂[Ni(OC₆H₄C(O)NHCH₂CH₂NHC(O)C₆H₄O)]

XPS Formula:

all nitrogen atoms

Name:

bis(tetraethylammonium) N,N'-ethylenebis(2-hydroxybenzamide)nickelate(II)

CAS Registry No:

Class:

nitrogen, organometallic, other ring, oxygen, phenyl benzene

Citation:

Author Name(s):

Colpas G.J., Maroney M.J., Bagyinka C., Kumar M., Willis W.S., Suib S.L., et al.

Journal:

Inorg. Chem. 30, 920

DOI:

Pub Year:

1991

bookAll Records in this Publication

Data Processing:

Photoelectron Line

398.10

0.2

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Au,Cu = 84.00,932.67

Charge Reference:

Internal hydrocarbon

Energy Scale Evaluation:

Reliable, with two-point correction of energy scale

Comment:

FAT mode. No x-ray induced damage to the sample was detected during analysis.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

X-ray Diffraction

Specimen Temperature (K):

300