NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

N

(MgO)₀.₀₄₇Si₃N₄

magnesium oxide trisilicon tetranitride

CAS Registry No:

nitride, oxide

Citation:

Author Name(s):

Hagio T., Takase A., Umebayashi S.

J. Mater. Sci. Lett. 11, 878

Pub Year:

1992

book All Records in this Publication

Data Processing:

Photoelectron Line

Line Designation:

1s

Binding Energy (eV)

397.70

Energy Uncertainty:

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

2.1

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

No

Anode Material:

Mg

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Argon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

0.047 is a weight quantity. The sample was obtained by hot-pressing Si3N4 with 4.7 wt% MgO at 2023 K at a pressure of 50 MPa. The sample was cleaned by Ar+ ion bombardment (Ep = 400 eV, time = 200 s). No Ar+ ion-induced damage to the sample was detected.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300

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