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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:


Tab Page Summary

General:
C6H5SH/Ni
carbidic carbon
benzenethiol/nickel
carbide, element, phenyl benzene, sulfur, thiol

Citation:
Huntley D.R.
J. Phys. Chem. 96, 4550
Pub Year:
1992

Data Processing:
Photoelectron Line

Measurement:
Anode Material:
Mg
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Other, Ni3p3/2 = 66.08
Charge Reference:
Conductor
Energy Scale Evaluation:
Reliable, with one-point correction of energy scale
Comment:
0.45 ML (sulfur coverage) C6H5SH was adsorbed onto Ni(110) at 100 K and annealed to more 400 K. The substrate was cleaned by Ne+ ion bombardment and subsequently annealed (T = 1000 K, time = 60 s).

Specimen:
Method of Determining Specimen Composition:
Auger Electron Spectroscopy
Method of Determining Specimen Crystallinity:
Low-energy Electron Diffraction
Specimen Temperature (K):
300

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