NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

TiO₂

titanium(IV) dioxide

13463-67-7

catalyst, IV-VI semiconductor, mineral, oxide

Citation:

Author Name(s):

Ingo G.M., Dire S., Babonneau F.

Journal:

Appl. Surf. Sci. 70, 230

DOI:

Pub Year:

1993

book All Records in this Publication

Data Processing:

Auger Parameter

AP-2p_3/2, L₃M₂₃M₂₃

872.90

0.15

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Au,CuLMM,Cu2p3= 84.00,334.95,932.67

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Reliable, with two-point correction of energy scale

Comment:

The powder was prepared via a sol-gel process and air thermal heating at 1273 K. FAT mode.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300