NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

C₄₈H₂₆N₄F₁₂

XPS Formula:

carbon atoms attached to F

Name:

5,10,15,20-tetrakis(4-(trifluoromethyl)phenyl)porphyrin

CAS Registry No:

Class:

halogenated compound, multiple rings, nitrogen, other ring, phenyl benzene, porphyrin

Citation:

Author Name(s):

Gassman P.G., Ghosh A., Almlof J.

Journal:

J. Am. Chem. Soc. 114, 9990

DOI:

Pub Year:

1992

bookAll Records in this Publication

Data Processing:

Photoelectron Line

292.70

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Yes

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Au,Cu = 84.00,932.67

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300