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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:


Tab Page Summary

General:
Cu/(-C4HS((CH2)5CH3)-)n
sulfur atoms of pure poly(3-hexylthophene)
copper/poly(3-hexylthiophene)
104934-50-1
organometallic, other ring, polymer, sulfur, thiol

Citation:
Lachkar A., Selmani A., Sacher E., Leclerc M., Mokhliss R.
Synthetic Metals 66, 209
Pub Year:
1994

Data Processing:
Photoelectron Line
other type of curve fit

Measurement:
Anode Material:
Mg
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Internal hydrocarbon
Energy Scale Evaluation:
Reliable, with one-point correction of energy scale
Comment:
18 A Cu/(-C4SH((CH2)5CH3)-)n. The substrate composition determined by XPS was C10S. Branching ratio = 0.5.

Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300

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