NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

(C₂H₅)₂NC₆H₄CHNN(C₆H₅)₂

XPS Formula:

carbon atoms attached to N

Name:

4-diethylaminobenzaldehyde diphenylhydrazone

CAS Registry No:

Class:

azo, nitrogen, phenyl benzene

Citation:

Author Name(s):

Waltman R.J., Pacansky J., Bates C.W., Jr

Journal:

Chem. Mater. 5, 1799

DOI:

Pub Year:

1993

bookAll Records in this Publication

Data Processing:

Photoelectron Line

286.00

Background Subtraction Method:

other

Peak Location Method:

other type of curve fit

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Internal hydrocarbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

The film thickness was 1800 A. The composition determined by XPS was C0.886N0.114. No radiation damage was detected.

Specimen:

Method of Determining Specimen Composition:

X-ray Photoelectron Spectroscopy

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300