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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:


Tab Page Summary

General:
Ag/Si
silver/silicon
element

Citation:
Le Lay G., Johnson R.L., Seemann R., Grey F., Feidenhans'l R., and Nielsen M.
Surf. Sci. 287, 539
Pub Year:
1993

Data Processing:
Doublet Separation for Photoelectron Lines
mixed Gaussian/Lorentzian

Measurement:
Anode Material:
other source
X-ray Energy:
60
Overall Energy Resolution (eV):
0.35
Calibration:
Charge Reference:
Element
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
Si(111)-(R3xR3)-Ag. Branching ratio = 0.56.

Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
XPS–scanning Tunneling Microscopy, Low-energy Electron Diffraction
Specimen Temperature (K):
300

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