NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

CsCl

cesium chloride

7647-17-8

alkali, chloride

Citation:

Author Name(s):

Kamada M., Aita O., Ichikawa K., Okusawa M., Tsutsumi K.

Journal:

Phys. Rev. B 45, 12725

DOI:

Pub Year:

1992

book All Records in this Publication

Data Processing:

Auger-Electron Line

N₄₅O₂₃O₂₃

49.00

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

other source

X-ray Energy:

100

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Valence band minimum

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300