There was a problem with the connection!

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
O
Formula:
(P2O5)29.7(SnO)55.3(ZnO)15
XPS Formula:
non-bridging oxygen atoms
Name:
diphosphorus pentoxide tin oxide zinc oxide ((P2O5)29.7(SnO)55.3(ZnO)15)
CAS Registry No:
Class:
glass, oxide

Citation:
Author Name(s):
Onyiriuka E.C.
Journal:
J. Non-cryst. Solids 163, 268
DOI:
Pub Year:
1993

Data Processing:
Data Type:
Photoelectron Line
Line Designation:
1s
Binding Energy (eV)
531.30
Energy Uncertainty:
Background Subtraction Method:
other
Peak Location Method:
mixed Gaussian/Lorentzian
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):

Measurement:
Use of X-ray Monochromator:
No
Anode Material:
Mg
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Adventitious carbon
Energy Scale Evaluation:
Reliable, with one-point correction of energy scale
Comment:
The sample was prepared from ZnO, SnO, and NH4H2PO4 batch materials which were melted at 1273 K for 3 h and annealed at 573 K. The intensity ratio of the non-bridging/bridging oxygen components was 84.6/15.4.

Specimen:
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300
An error has occurred. This application may no longer respond until reloaded. Reload 🗙