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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
Ge
Formula:
Sn/Ge
XPS Formula:
rest atoms corresponding to 7/36 ML
Name:
tin/germanium
CAS Registry No:
7440-56-4
Class:
element

Citation:
Author Name(s):
Gothelid M., Grehk T.M., Hammar M., Karlsson U.O., Flodstrom S.A.
Journal:
Phys. Rev. B 48, 2012
DOI:
Pub Year:
1993

Data Processing:
Data Type:
Surface Core-level Shift
Line Designation:
SS-3d5/2
Surface Core-Level Shift (eV)
-0.64
Energy Uncertainty:
Background Subtraction Method:
other
Peak Location Method:
mixed Gaussian/Lorentzian
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
0.75
Lorentzian Width (eV):
0.30

Measurement:
Use of X-ray Monochromator:
Yes
Anode Material:
other source
X-ray Energy:
70, 90,110
Overall Energy Resolution (eV):
0.09
Calibration:
Charge Reference:
Element
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
Ga-doped Ge(111)-(7x7)-Sn with a resistivity of 0.004 - 0.1 ohm cm. The (7x7) reconstruction was prepared by deposition of 0.4 ML of Sn, and subsequent annealing (T = 773 K) for a few minutes.

Specimen:
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Low-energy Electron Diffraction
Specimen Temperature (K):
77, 300
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