There was a problem with the connection!

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:


Tab Page Summary

General:
GeSe2
germanium diselenide
12065-11-1
chalcogenide, glass, II-VI semiconductor, IV-VI semiconductor, selenide

Citation:
Theye M.-L., Gheorgiu A., Senemaud C., Kotkata M.F., Kandil K.M.
Phil. Mag. B 69, 209
Pub Year:
1994

Data Processing:
Photoelectron Line

Measurement:
Anode Material:
Mg
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Adventitious carbon
Energy Scale Evaluation:
Reliable, with one-point correction of energy scale
Comment:

Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300

An error has occurred. This application may no longer respond until reloaded. Reload 🗙