NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Ge₀.₂₀Se₀.₈₀

germanium selenium

chalcogenide, glass, IV-VI semiconductor, selenide

Citation:

Author Name(s):

Theye M.-L., Gheorgiu A., Senemaud C., Kotkata M.F., Kandil K.M.

Journal:

Phil. Mag. B 69, 209

DOI:

Pub Year:

1994

bookAll Records in this Publication

Data Processing:

Photoelectron Line

31.40

0.1

Background Subtraction Method:

Peak Location Method:

Gaussian

Full Width at Half-maximum Intensity (eV):

1.3

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

The sample was prepared by thermal evaporation.

Specimen:

Method of Determining Specimen Composition:

Electron-Probe Microanalysis

Method of Determining Specimen Crystallinity:

X-ray Diffraction

Specimen Temperature (K):

300