NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

HN₃/Si

H^-N=N*=&N/Si

hydrogen azide/silicon

CAS Registry No:

7782-79-8

Class:

azide

Citation:

Author Name(s):

Chu J.C.S., Bu Y., Lin M.C.

Journal:

Surf. Sci. 284, 281

DOI:

Pub Year:

1993

bookAll Records in this Publication

Data Processing:

Photoelectron Line

402.80

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

1.7

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Yes

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Si2p = 99.34

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

2.0 +- 0.5 L HN3/B-doped Si(111)-(7x7) with a resistivity of 10 ohm cm. The substrate was annealed at temperature more than 1500 K.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Low-energy Electron Diffraction

Specimen Temperature (K):

120