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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:


Tab Page Summary

General:
Pb/Ge
lead/germanium
element

Citation:
Carlisle J.A., Miller T., Chiang T.-C.
Phys. Rev. B 47, 3790
Pub Year:
1993

Data Processing:
Interface Core-Level Shift
mixed Gaussian/Lorentzian

Measurement:
Anode Material:
other source
X-ray Energy:
90
Overall Energy Resolution (eV):
0.17
Calibration:
FL = Fermi level
Charge Reference:
Conductor
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
1/6 ML Pb/Ge(111)-(R3xR3)R30 degrees. The sample was cleaned by several cycles of Ar+ ion bombardment (Ep = 500 eV) while annealing at 773 K followed by 15 min anneals at 1073 K. Peak locations: Voigt function. Branching ratio = 0.591. The intensity ratio of the surface/bulk components was 0.385.

Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
X-ray Diffraction, High-energy Electron Diffraction
Specimen Temperature (K):
300

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