NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

TiN₀.₂₀

Name:

titanium nitride (TiN0.20)

CAS Registry No:

Class:

nitride

Citation:

Author Name(s):

Kuznetsov M.V., Zhuravlev M.V., Shalayeva E.V., Gubanov V.A.

Journal:

Thin Solid Films 215, 1

DOI:

Pub Year:

1992

bookAll Records in this Publication

Data Processing:

Photoelectron Line

397.10

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Ti2p3/2 = 453.98

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

The surface was cleaned by Ar+ ion bombardment (Ep = 6 keV, Ip = 20 microamperes).

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300