NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

C₆₀I₃.₇₆

carbon iodine

addition compound, cluster, IV-VI semiconductor

Citation:

Author Name(s):

Werner H., Wesemann M., Schlogl R.

Journal:

Europhys. Lett. 20, 107

DOI:

Pub Year:

1992

bookAll Records in this Publication

Data Processing:

Photoelectron Line

285.00

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

1.28

Calibration:

Au4f7 = 84.00

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

The composition determined by XPS was C94.4I52.2O0.2.

Specimen:

Method of Determining Specimen Composition:

X-ray Photoelectron Spectroscopy

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300