Tab Page Summary
element, IV semiconductor, non-stoichiometric oxide, oxide
Behner H., Wecker J., Matthee T., Samwer K.
Surf. Interface Anal. 18, 685
Overall Energy Resolution (eV):
0.9
Calibration:
Au4f7 = 84.00
Charge Reference:
Conductor
Energy Scale Evaluation:
Reliable, with one-point correction of energy scale
Comment:
17 A SiO2/p-type Si(100) with a resistivity of 1ohm cm. The thickness was measured by XPS.
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300