NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

XPS Formula:

atoms in the outermost layer

Name:

beryllium

CAS Registry No:

7440-41-7

Class:

alkaline earth, element

Citation:

Author Name(s):

Johansson L.I., Sernelius B.E.

Journal:

Phys. Rev. B 50, 16817

DOI:

Pub Year:

1994

book All Records in this Publication

Data Processing:

Data Type:

Surface Core-level Shift for the Second Layer of Atoms

Line Designation:

SS1-1s

Surface Core-Level Shift (eV) for the first Layer of Atoms

-0.70

Energy Uncertainty:

Background Subtraction Method:

other

Peak Location Method:

other type of curve fit

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

other source

X-ray Energy:

123 - 180

Overall Energy Resolution (eV):

0.07

Calibration:

Charge Reference:

Element

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

Be(10-10)-(1x1). FAT mode.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Low-energy Electron Diffraction

Specimen Temperature (K):

100