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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
Se
Formula:
In2Se3
Name:
diindium triselenide
CAS Registry No:
12056-07-4
Class:
chalcogenide, II-VI semiconductor, selenide

Citation:
Author Name(s):
Nelson A.J., Swartzlander A.B., Tuttle J.R., Noufi R., Patel R., and Hochst H.
Journal:
J. Appl. Phys. 74, 5757
DOI:
Pub Year:
1993

Data Processing:
Data Type:
Photoelectron Line
Line Designation:
3d3/2
Binding Energy (eV)
54.00
Energy Uncertainty:
Background Subtraction Method:
Peak Location Method:
data
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):

Measurement:
Use of X-ray Monochromator:
No
Anode Material:
other source
X-ray Energy:
70, 100
Overall Energy Resolution (eV):
0.2
Calibration:
Charge Reference:
Valence band minimum
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
200 nm n-type In2Se3/700 - 900 nm CuIn3Se5/CuInSe2. The sample was cleaned by Ar+ ion bombardment (Ep = 500 eV, angle of incidence = 30 degrees). The spectra were recorded at normal emission.

Specimen:
Specimen:
Method of Determining Specimen Composition:
Electron-Probe Microanalysis
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300
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