NIST X-ray Photoelectron Spectroscopy Database

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Total Records: 8

Element

Atomic No

Formula

Spectral Line

Energy (eV)

Details

In₂Se₃

4d_5/2

17.20

In₂Se₃

4d_3/2

18.00

In₂Se₃

3d_5/2

53.40

In₂Se₃

3d_3/2

54.00

In₂Se₃

4d_5/2

18.00

In₂Se₃

4d_3/2

18.80

In₂Se₃

3d_5/2

54.20

In₂Se₃

3d_3/2

54.80

Data Processing:

Photoelectron Line

3d_5/2

54.20

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

other source

X-ray Energy:

70, 100

Overall Energy Resolution (eV):

0.2

Calibration:

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

200 nm n-type In2Se3/700 - 900 nm CuIn3Se5/CuInSe2. The sample was cleaned by Ar+ ion bombardment (Ep = 500 eV, angle of incidence = 30 degrees). The spectra were recorded at normal emission. The Fermi-level position was determined from a clean Ta surface in a contact with the sample.

Specimen:

Method of Determining Specimen Composition:

Electron-Probe Microanalysis

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300