NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

CuS

copper sulfide

1317-40-4

chalcogenide, II-VI semiconductor, IV-VI semiconductor, mineral, sulfide

Citation:

Author Name(s):

Scheer R., Lewerenz H.J.

Journal:

J. Vac. Sci. Technol. A 12, 56

DOI:

Pub Year:

1994

book All Records in this Publication

Data Processing:

Photoelectron Line

2p_3/2

932.20

0.1

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Cu2p3, L3MM = 932.67, 334.95

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable, with two-point correction of energy scale

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300