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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
Ti
Formula:
TiO2
Name:
titanium(IV) dioxide
CAS Registry No:
13463-67-7
Class:
catalyst, IV-VI semiconductor, mineral, oxide

Citation:
Author Name(s):
Sanjines R., Tang H., Berger H., Gozzo F., Margaritondo G., and Levy F.
Journal:
J. Appl. Phys. 75, 2945
DOI:
Pub Year:
1994

Data Processing:
Data Type:
Photoelectron Line
Line Designation:
2p3/2
Binding Energy (eV)
458.80
Energy Uncertainty:
Background Subtraction Method:
Peak Location Method:
mixed Gaussian/Lorentzian
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):

Measurement:
Use of X-ray Monochromator:
Yes
Anode Material:
Al
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Adventitious carbon
Energy Scale Evaluation:
Reliable, with one-point correction of energy scale
Comment:
The anatase thin film was deposited by reactive sputtering onto 573 K heated substrates. The total FWHM was 1.17 eV. The spectra were recorded at normal emission and 25 degrees.

Specimen:
Specimen:
Method of Determining Specimen Composition:
X-ray Photoelectron Spectroscopy
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300
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