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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
Zn
Formula:
ZnSe/CuInSe2
Name:
zinc selenide/copper indium diselenide
CAS Registry No:
1315-09-9
Class:
chalcogenide, II-VI semiconductor, selenide

Citation:
Author Name(s):
Nelson A.J., Niles D.W., Schwerdtfeger C.R., Wei S.-H., Zunger A., and Hochst H.
Journal:
J. Electron Spectrosc. Relat. Phenom. 68, 185
DOI:
Pub Year:
1994

Data Processing:
Data Type:
Photoelectron Line
Line Designation:
3d
Binding Energy (eV)
9.25
Energy Uncertainty:
Background Subtraction Method:
Peak Location Method:
data
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):

Measurement:
Use of X-ray Monochromator:
Yes
Anode Material:
other source
X-ray Energy:
70
Overall Energy Resolution (eV):
0.1
Calibration:
Charge Reference:
Valence band minimum
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
31 and 70 A ZnSe were deposited at 473 K onto n-type CuInSe2(112) cleaned by Ar+ ion bombardment (Ep = 500 eV, angle of incidence = 30 degrees) and annealing (T = 773 K, time = ~2 min). The thickness was measured using a quartz-crystal thickness monitor. The spectra were recorded at normal emission.

Specimen:
Specimen:
Method of Determining Specimen Composition:
Electron-Probe Microanalysis
Method of Determining Specimen Crystallinity:
X-ray Diffraction
Specimen Temperature (K):
300
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