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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
Al
Formula:
Al/Cs
Name:
aluminum/cesium
CAS Registry No:
7429-90-5
Class:
element

Citation:
Author Name(s):
Andersen J.N., Lundgren E., Nyholm R., Qvarford M.
Journal:
Surf. Sci. 289, 307
DOI:
Pub Year:
1993

Data Processing:
Data Type:
Surface Core-level Shift
Line Designation:
SS-2p
Surface Core-Level Shift (eV)
-0.35
Energy Uncertainty:
Background Subtraction Method:
Peak Location Method:
data
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):

Measurement:
Use of X-ray Monochromator:
Yes
Anode Material:
other source
X-ray Energy:
Overall Energy Resolution (eV):
0.04
Calibration:
FL = Fermi level
Charge Reference:
Conductor
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
0.33 ML Cs/Al(111)-(2R3x2R3)R30. The Al(111) crystal was cleaned by cycles of Ar+ ion bombardment and annealing (T = ~700 K). The spectra were recorded at normal emission.

Specimen:
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Low-energy Electron Diffraction
Specimen Temperature (K):
300
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