NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

CdS

cadmium sulfide

1306-23-6

chalcogenide, II-VI semiconductor, IV-VI semiconductor, mineral, organometallic, sulfide

Citation:

Author Name(s):

Tkachenko O.P., Shpiro E.S., Wark M., Schulz-Ekloff G., Jaeger N.I.

Journal:

J. Chem. Soc. Faraday Trans. 89, 3987

DOI:

Pub Year:

1993

bookAll Records in this Publication

Data Processing:

Photoelectron Line

11.50

0.2

Background Subtraction Method:

other

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

2.0

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

Al/Mg

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

The S/Cd composition ratio determined by XPS was 0.89.

Specimen:

Method of Determining Specimen Composition:

X-ray Photoelectron Spectroscopy

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300