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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
N
Formula:
TiN
Name:
titanium nitride
CAS Registry No:
25583-20-4
Class:
nitride

Citation:
Author Name(s):
Johansson L.I., Johansson H.I.P., Hakansson K.L.
Journal:
Phys. Rev. B 48, 14520
DOI:
Pub Year:
1993

Data Processing:
Data Type:
Surface Core-level Shift
Line Designation:
SS-1s
Surface Core-Level Shift (eV)
-0.57
Energy Uncertainty:
0.02
Background Subtraction Method:
other
Peak Location Method:
mixed Gaussian/Lorentzian
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
0.36
Lorentzian Width (eV):
0.36

Measurement:
Use of X-ray Monochromator:
Yes
Anode Material:
other source
X-ray Energy:
430
Overall Energy Resolution (eV):
0.36
Calibration:
Charge Reference:
Element
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
TiN(100)-(1x1). The surface was cleaned by a 5-min Ar+ ion bombardment and by repeated flash heatings. The Lorentzian FWHM of the bulk component was 0.40 eV. The Gaussian FWHM was 0.41 eV at 500 eV. Asymmetry parameter = 0.0

Specimen:
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Low-energy Electron Diffraction
Specimen Temperature (K):
300
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