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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
C
Formula:
TiC
XPS Formula:
carbon atoms segregated to the surface
Name:
titanium carbide
CAS Registry No:
12070-08-5
Class:
carbide

Citation:
Author Name(s):
Johansson L.I., Johansson H.I.P., Hakansson K.L.
Journal:
Phys. Rev. B 48, 14520
DOI:
Pub Year:
1993

Data Processing:
Data Type:
Surface Core-level Shift for the Second Layer of Atoms
Line Designation:
SS2-1s
Surface Core-Level Shift (eV) for the second Layer of Atoms
0.43
Energy Uncertainty:
0.04
Background Subtraction Method:
other
Peak Location Method:
mixed Gaussian/Lorentzian
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
0.23
Lorentzian Width (eV):
0.40

Measurement:
Use of X-ray Monochromator:
Yes
Anode Material:
other source
X-ray Energy:
330
Overall Energy Resolution (eV):
0.23
Calibration:
Charge Reference:
Element
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
TiC(100)-(1x1). The surface was cleaned by a 5-min Ar+ ion bombardment and by repeated flash heatings. The Lorentzian FWHM of the bulk component was 0.26 eV. The Gaussian FWHM was 0.27 eV at 380 eV. Asymmetry parameter = 0.04.

Specimen:
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Low-energy Electron Diffraction
Specimen Temperature (K):
300
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