NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Ti/Ta

titanium/tantalum

7440-32-6

element

Citation:

Author Name(s):

Gleason N.R., Strongin D.R.

Journal:

Surf. Sci. 295, 306

DOI:

Pub Year:

1993

bookAll Records in this Publication

Data Processing:

Photoelectron Line

2p_3/2

454.10

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Other, Fe2p3 = 706.86

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

100 A Ti/Ta. FAT mode.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300