There was a problem with the connection!

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:


Tab Page Summary

General:
ditantalum nitride
nitride

Citation:
Prieto P., Galan L., Sanz J.M.
Appl. Surf. Sci. 70, 186
Pub Year:
1993

Data Processing:
Photoelectron Line

Measurement:
Anode Material:
Mg
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
FL = Fermi level
Charge Reference:
Conductor
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
Ta2N thin film 3000 A thick was grown onto glass by reactive sputtering in a nitrogen atmosphere. The sample was cleaned by cycles of Ar+ ion bombardment (Ep = 2 keV, j = 2 microamperes cm-2) and annealing (T = 1300 K).

Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
X-ray Diffraction
Specimen Temperature (K):
300

An error has occurred. This application may no longer respond until reloaded. Reload 🗙