NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

InPOx

InP state

indium phosphorus oxides

CAS Registry No:

22398-80-7

Class:

hydroxide, III-V semiconductor, non-stoichiometric oxide, phosphide

Citation:

Author Name(s):

Zemek J., Baschenko O.A., Tyzykhov M.A.

Journal:

Thin Solid Films 224, 141

DOI:

Pub Year:

1993

bookAll Records in this Publication

Data Processing:

Photoelectron Line

129.00

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Au4f7 = 84.00

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

Sn-doped InP(100). The spectra were recorded at normal emission and 65 degrees.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300