NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

Ta₃N₅

Name:

tritantalum pentanitride

CAS Registry No:

12033-94-2

Class:

nitride

Citation:

Author Name(s):

Fix R., Gordon R.G., Hoffman D.M.

Journal:

Chem. Mater. 5, 614

DOI:

Pub Year:

1993

bookAll Records in this Publication

Data Processing:

Photoelectron Line

397.10

0.2

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

Al/Mg

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Au4f7 = 84.00

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

The sample was prepared by CVD at 378 K. The composition determined by RBS wasTaN1.7+-0.1. FAT mode.

Specimen:

Method of Determining Specimen Composition:

Rutherford Backscattering Spectrometry

Method of Determining Specimen Crystallinity:

X-ray Diffraction

Specimen Temperature (K):

300