NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

CuInSSe

Name:

copper indium sulfide selenide

CAS Registry No:

142816-50-0

Class:

chalcogenide, II-VI semiconductor, selenide, sulfide

Citation:

Author Name(s):

Landry C.C., Barron A.R.

Journal:

Science 260, 1653

DOI:

Pub Year:

1993

bookAll Records in this Publication

Data Processing:

Photoelectron Line

3d_5/2

444.90

0.1

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Yes

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Au4f7 = 84.00

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

FAT mode.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

X-ray Diffraction

Specimen Temperature (K):

300