NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

C

(^-C₆H₄OC₆H₄OC₆H₄C(O)^-)n

carbon atoms singly attached to O

poly(oxy-1,4-phenyleneoxy-1,4-phenylenecarbonyl-1,4-phenylene)

CAS Registry No:

31694-16-3

ether, ketone, oxygen, phenyl benzene, polymer, sulfur

Citation:

Author Name(s):

Payne R.S., Beamson G.

Polymer 34, 1637

Pub Year:

1993

bookAll Records in this Publication

Data Processing:

Photoelectron Line

Line Designation:

1s

Binding Energy (eV)

286.42

Energy Uncertainty:

0.025

Background Subtraction Method:

Linear

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Yes

Anode Material:

Al

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Internal hydrocarbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

FAT mode. Emission angle = 30 degrees. The total FWHM is 1.02 eV. The O/C composition ratio determined by XPS was 15.6/84.4. The relative intensity was 0.178. Asymmetry parameter = 0.09. An electron flood gun was used for charge compensation. poly(ether ether ketone)

Specimen:

Method of Determining Specimen Composition:

X-ray Photoelectron Spectroscopy

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300

An error has occurred. This application may no longer respond until reloaded. Reload 🗙