NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Gd/W

gadolinium/tungsten

7440-54-2

element

Citation:

Author Name(s):

Ortega J.E., Himpsel F.J., Li D., Dowben P.A.

Journal:

Solid State Commun. 91, 807

DOI:

Pub Year:

1994

book All Records in this Publication

Data Processing:

Data Type:

Surface Core-level Shift

Line Designation:

SS-4f

Surface Core-Level Shift (eV)

0.40

Energy Uncertainty:

Background Subtraction Method:

other

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

other source

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

FL = Fermi level

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

30 A Gd(0001)/W(110) after annealing to 530 K. The relative intensity of the surface component was 0.67.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300