NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

V

VC₀.₈₀

vanadium carbide (VC0.80)

CAS Registry No:

carbide

Citation:

Author Name(s):

Hakansson K.L., Johansson L.I., Hammar M., Gothelid M.

Phys. Rev. B 47, 10769

Pub Year:

1993

book All Records in this Publication

Data Processing:

Surface Core-level Shift

Line Designation:

SS-2p_3/2

Surface Core-Level Shift (eV)

0.00

Energy Uncertainty:

0.02

Background Subtraction Method:

other

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

0.4

Lorentzian Width (eV):

0.7

Measurement:

Use of X-ray Monochromator:

Yes

Anode Material:

other source

X-ray Energy:

600

Overall Energy Resolution (eV):

0.4

Calibration:

Charge Reference:

Element

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

VC0.80(100), VC0.80(111)-(1x1) and VC0.80(111)-(8x1). Asymmetry parameter = 0.2. The (100) surface was cleaned by flash heatings (T ~1373 K), the (111) surface was bombarded by Ar+ ions and annealed to 1073 K for a few minutes to produce the 1x1 surface and to 1423 K to produce the 8x1 surface.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Low-energy Electron Diffraction

Specimen Temperature (K):

300

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