NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

WSe₂

tungsten diselenide

12067-46-8

chalcogenide, II-VI semiconductor, IV-VI semiconductor, selenide

Citation:

Author Name(s):

Salitra G., Hodes G., Klein E., Tenne R.

Journal:

Thin Solid Films 245, 180

DOI:

Pub Year:

1994

book All Records in this Publication

Data Processing:

Photoelectron Line

4f_5/2

34.80

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

Hexagonal structure. The composition determined by XPS was WSe2.18.

Specimen:

Method of Determining Specimen Composition:

X-ray Photoelectron Spectroscopy

Method of Determining Specimen Crystallinity:

X-ray Diffraction

Specimen Temperature (K):

300