NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

((CH₃)₂NH₂)₆[(SCN)₉W₃S₄SnCl₃].₀.5H₂O

Name:

hexakis(dimethylammonium) tetrakis-mu3-thio-thrichlorotin-tris(trithiocyanatotungstate) semihydrate

CAS Registry No:

Class:

(iso)thiocyanate, chloride, hydrate, sulfur ligand, thiol

Citation:

Author Name(s):

Muller A., Fedin V.P., Diemann E., Bogge H., Krickemeyer E., Solter D., et al.

Journal:

Inorg. Chem. 33, 2243

DOI:

Pub Year:

1994

book All Records in this Publication

Data Processing:

Photoelectron Line

4f_7/2

33.20

0.5

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

X-ray Diffraction

Specimen Temperature (K):